phoenix v|tome|x m

Industrial CT scanner for 3D metrology
and analysis


Improve safety, throughput, and profit. The phoenix v|tome|x m delivers more accurate measurements at higher speeds than ever before with scatter|correct technology to help remove artifacts for higher image quality.


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As the most powerful X-ray microfocus CT system designed for 3D metrology and analysis, it delivers industry-leading magnification at 300kV with high throughputs, automation, flexibility, and precision.

10x increased sensitivity

over standard DXR detectors

2-3x cycle time increase

without impacting image quality

2x faster scan times

With high-flux|target for higher
power on smaller focal point

For more information, visit our website.